In the scanning transmission electron microscopy stem mode the microscope lenses are adjusted to create a focused convergent electron beam or probe at the sample surface this focused probe is then scanned across the sample and various signals are collected point by point to form an image. This video is unavailable watch queue queue watch queue queue. Scanning transmission electron microscopy stem combines the principles of transmission electron microscopy and scanning electron microscopy and can be performed on either type of instrument like tem stem requires very thin samples and looks primarily at beam electrons transmitted by the sample. Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity and the editors of this book are widely credited with bringing the field to its present popularity. There are other imaging modes in stem such as electron holography and lorentz electron microscopy these methods use the phase of electron waves in this chapter we give an overview of these methods although not quite as many papers on these topics have been published
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